Gutierrez Gil, Valentin

Perfil en ORCID: 0000-0003-1902-4750

Grupos de Investigación

• DISEÑO Y TEST DE CIRCUITOS INTEGRADOS DE SEÑAL MIXTA

Publicaciones

Publicaciones en Revistas:

• Gutierrez, Valentin, Leger-, Gildas:
  An adaptive simulation framework for AMS-RF test quality. En: Integration. 2020. Vol. 73. Núm. . Pag. 10-17 10.1016/j.vlsi.2020.03.003
• Gutierrez, Valentin, Gines-Arteaga, Antonio Jose, Leger-, Gildas:
  Assessing AMS-RF Test Quality by Defect Simulation. En: IEEE Transactions on Device and Materials Reliability. 2019. Vol. 19. Núm. 1. Pag. 55-63

Aportaciones a Congresos:

• Gutierrez, Valentin, Leger-, Gildas:
  On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. Comunicación en congreso. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). Montreal, Canada. 2020
• Gutierrez, Valentin, Leger, Gildas:
  SET sensitivity evaluation, a comparison before and after layout. Comunicación en congreso. 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS). BILBAO (ESPAÑA). 2019
• Gutierrez, Valentin, Leger-, Gildas:
  Adaptive defect simulation flow for Defect-oriented Test evaluation. Sesión no plenaria en Congreso. 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). Lausanne, ALPINE CENTER PIORA, SWITZERLAND. 2019
• Gutierrez, Valentin, Gines-Arteaga, Antonio Jose, Leger-, Gildas:
  AMS-RF test quality: Assessing defect severity.. Comunicación en congreso. IEEE International Symposium on On-Line Testing And Robust System Design. Platja d'Aro, Spain. 2018
• Gutierrez, Valentin, Leger-, Gildas:
  Single Event Transient injection in large mixed-signal circuits. Sesión no plenaria en Congreso. 2018 Conference on Design of Circuits and Integrated Systems (DCIS). Lyon, France. 2018